Structural, Morphological, and Optical Study of the Fe-doped ZnO Thin Film

Authors

  • Arun Kumar Ion Beam Centre, Department of Physics, Kurukshetra University, Kurukshetra-136119, India.
  • Sanjeev Aggarwal Ion Beam Centre, Department of Physics, Kurukshetra University, Kurukshetra-136119, India.
  • Mahavir Singh Department of Physics, Himachal Pradesh University, Shimla-171005, India.

DOI:

https://doi.org/10.9734/bpi/cppsr/v7/7590E

Keywords:

R F sputtering, Atomic Force Microscopy (AFM), UV Vis Spectroscopy

Abstract

Fe-doped ZnO Dilute Magnetic Semiconductor (DMS) thin film prepared by R F magnetron sputtering on a glass substrate and the Influence of Fe-doping at 3% on structural, morphological, and optical properties has been studied. The X-ray Diffraction (XRD) analysis shows that Fe doping has a significant effect on crystalline structure, grain size, and strain in the thin film. Crystalline structure is obtained for 3% Fe doping as observed from Atomic Force Microscopy (AFM) and X-ray Diffraction (XRD). UV-visible spectroscopy was used to study the optical behavior of the thin films.

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Published

2024-02-15

How to Cite

Arun Kumar, Sanjeev Aggarwal, & Mahavir Singh. (2024). Structural, Morphological, and Optical Study of the Fe-doped ZnO Thin Film. Current Perspective to Physical Science Research Vol. 7, 1–9. https://doi.org/10.9734/bpi/cppsr/v7/7590E

Issue

Current Perspective to Physical Science Research Vol. 7

Section

Chapters