Structural, Morphological, and Optical Study of the Fe-doped ZnO Thin Film
Current Perspective to Physical Science Research Vol. 7,
15 February 2024,
Page 1-9
https://doi.org/10.9734/bpi/cppsr/v7/7590E
Fe-doped ZnO Dilute Magnetic Semiconductor (DMS) thin film prepared by R F magnetron sputtering on a glass substrate and the Influence of Fe-doping at 3% on structural, morphological, and optical properties has been studied. The X-ray Diffraction (XRD) analysis shows that Fe doping has a significant effect on crystalline structure, grain size, and strain in the thin film. Crystalline structure is obtained for 3% Fe doping as observed from Atomic Force Microscopy (AFM) and X-ray Diffraction (XRD). UV-visible spectroscopy was used to study the optical behavior of the thin films.