Jeffrey O. WAND; Steven B. KIM. Application of Sequential Probability Ratio Test for Reliability and Validity Studies. Theory and Practice of Mathematics and Computer Science Vol. 9, [S. l.], p. 61–75, 2021. DOI: 10.9734/bpi/tpmcs/v9/7792D. Disponível em: https://stm.bookpi.org/TPMCS-V9/article/view/852. Acesso em: 14 jun. 2026.