M. USPENSKY. Difficulties in Reliability Evaluation of Microprocessor Protections. Techniques and Innovation in Engineering Research Vol. 4, [S. l.], p. 58–65, 2022. DOI: 10.9734/bpi/taier/v4/3622B. Disponível em: https://stm.bookpi.org/TAIER-V4/article/view/8704. Acesso em: 13 jun. 2026.