S. TOUMI; T. GUERFI. Study of Poole-Frenkel Emission Current in Metal/Oxide/Semiconductor Structures Including the Correction of the Oxide Voltage and Temperature Effects on Key Parameters. Science and Technology: Developments and Applications Vol. 7, [S. l.], p. 80–111, 2025. DOI: 10.9734/bpi/stda/v7/4834. Disponível em: https://stm.bookpi.org/STDA-V7/article/view/17674. Acesso em: 14 jun. 2026.