Modern Approach of Testing Multiple Faults (Toggling Faults, Bridge Faults, and SAT) of Combo & Sequential Blocks Using ROBDD

Authors

  • K. V. B. V. Rayudu Research Centre Imarat, DRDO, Hyderabad, India.
  • Jahagirdar Research Centre Imarat, DRDO, Hyderabad, India.
  • P. Sreehari Rao NIT Warangal, India.

DOI:

https://doi.org/10.9734/bpi/rader/v2/18015D

Keywords:

Configurable logic blocks, ROBDD, SAT, Sequential designs

Abstract

The main aim of the research to find the faults at all levels of all logic designs which involves in both combinational and sequential blocks of the design. In this study, we developed ROBDD (Reduced Ordered Binary Decision Diagram) designs to find toggling faults, bridge faults, and SAT (Stuck at Fault). Here, we developed sequential blocks using ROBDD and applied to the mux to find stuck at faults that connect to the combo. We also developed the bridges between the blocks of ROBDD designs and converting them to and or logic to find the bridge faults of the design. Toggle and bridge faults were derived using stuck at fault techniques. Focused on the path delays by referring the faults (toggling and bridge faults) at mux logic out using simple stuck at faults methods. In our research the basic design modules are ROBDD circuit of both combinational and sequential blocks are designed and tested using Multiplexer and K-map Simplification Methods. According to the modified research, modern tests for stuck-at-fault detections are unsatisfactory to detect the faults in multiple stuck- at-faults, bridge faults, and also toggling faults.

Published

2023-04-24

How to Cite

K. V. B. V. Rayudu, Jahagirdar, & P. Sreehari Rao. (2023). Modern Approach of Testing Multiple Faults (Toggling Faults, Bridge Faults, and SAT) of Combo & Sequential Blocks Using ROBDD. Research and Developments in Engineering Research Vol. 2, 53–70. https://doi.org/10.9734/bpi/rader/v2/18015D