Ho Soon MIN. Scanning Electron Microscopy Analysis of Thin Films: A Review. Research Aspects in Chemical and Materials Sciences Vol. 5, [S. l.], p. 16–28, 2022. DOI: 10.9734/bpi/racms/v5/4419E. Disponível em: https://stm.bookpi.org/RACMS-V5/article/view/8895. Acesso em: 9 jun. 2026.