R. Siddheswaran, et al. “TEM Cross-Section Sample (XTEM) Preparation of Nc-Si A-SiO2 Multi-Layer Thin Film Using Cryo Ar+ Ion Slicing for Microstructural Analyses”. Research Aspects in Chemical and Materials Sciences Vol. 2, July 2022, pp. 25-36, doi:10.9734/bpi/racms/v2/3260B.