[1]
André Ricard et al. 2025. N, H and C-atoms Concentrations in Flowing Afterglows of Microwave R/N\(_2\)-H\(_2\) and R/N\(_2\)-CH\(_4\) Discharges with R=N\(_2\), He, Ar and Their Applications to TiO\(_2\) Surface Nitriding. Plasmas Afterglows with N2 for Surface Treatments synthesis 2024. (Mar. 2025), 489–535. DOI:https://doi.org/10.9734/bpi/mono/978-93-49473-93-5/CH24.