Ho Soon MIN. Atomic Force Microscopy Characterization of Thin Films: A Review. New Frontiers in Physical Science Research Vol. 5, [S. l.], p. 165–177, 2022. DOI: 10.9734/bpi/nfpsr/v5/4574E. Disponível em: https://stm.bookpi.org/NFPSR-V5/article/view/8971. Acesso em: 9 jun. 2026.