Ho Soon MIN. Applications of Transmission Electron Microscopy Technique to Thin Film Studies: Review. New Frontiers in Physical Science Research Vol. 5, [S. l.], p. 53–65, 2022. DOI: 10.9734/bpi/nfpsr/v5/4452E. Disponível em: https://stm.bookpi.org/NFPSR-V5/article/view/8856. Acesso em: 13 jun. 2026.