Puspen MONDAL. Cross-Sectional TEM Specimen Preparation for W/B4C Multilayer Sample Using FIB: A Recent Study. New Approaches in Engineering Research Vol. 8, [S. l.], p. 96–100, 2021. DOI: 10.9734/bpi/naer/v8/9687D. Disponível em: https://stm.bookpi.org/NAER-V8/article/view/2272. Acesso em: 3 jul. 2026.