Hari Shankar Biswas. Scanning Probe Measurement to Study Annealing Effects on the Electrical and Structural Properties of HDLC Thin Films. NACB-V5 [Internet]. 2023 Aug. 11 [cited 2026 Jun. 10];:93-107. Available from: https://stm.bookpi.org/NACB-V5/article/view/11577