U. S. Mbamara. XRD, XPS and Dynamic SIMS Analyses of p-Type Zinc Oxynitride Thin Films Deposited on Silicon Wafers by MOCVD. FRAPS-V6 [Internet]. 2023 Jun. 8 [cited 2026 Jun. 4];:58-69. Available from: https://stm.bookpi.org/FRAPS-V6/article/view/10831