Mbamara, U. S. 2023. “XRD, XPS and Dynamic SIMS Analyses of P-Type Zinc Oxynitride Thin Films Deposited on Silicon Wafers by MOCVD”. Fundamental Research and Application of Physical Science Vol. 6, June, 58-69. https://doi.org/10.9734/bpi/fraps/v6/5828E.