U. S. MBAMARA. XRD, XPS and Dynamic SIMS Analyses of p-Type Zinc Oxynitride Thin Films Deposited on Silicon Wafers by MOCVD. Fundamental Research and Application of Physical Science Vol. 6, [S. l.], p. 58–69, 2023. DOI: 10.9734/bpi/fraps/v6/5828E. Disponível em: https://stm.bookpi.org/FRAPS-V6/article/view/10831. Acesso em: 4 jun. 2026.