U. S. Mbamara 2023. XRD, XPS and Dynamic SIMS Analyses of p-Type Zinc Oxynitride Thin Films Deposited on Silicon Wafers by MOCVD. Fundamental Research and Application of Physical Science Vol. 6. (Jun. 2023), 58–69. DOI:https://doi.org/10.9734/bpi/fraps/v6/5828E.