. KASMUDIN; K. REZON; A. SATMOKO. Determination of Optimum Thickness of Tantalum, Tungsten, and Lead as X-Rays Converter for 10 MeV Electron Beam Using MCNP. Fundamental Research and Application of Physical Science Vol. 3, [S. l.], p. 86–96, 2023. DOI: 10.9734/bpi/fraps/v3/5129B. Disponível em: https://stm.bookpi.org/FRAPS-V3/article/view/10341. Acesso em: 21 jul. 2026.