S. TOUMI; T. GUERFI. Characterization of Fowler-Nordheim Tunneling and Temperature Effects in Metal-Oxide-Semiconductor Structures Using Vertical Optimization. Current Research Progress in Physical Science Vol. 5, [S. l.], p. 154–177, 2024. DOI: 10.9734/bpi/crpps/v5/3289. Disponível em: https://stm.bookpi.org/CRPPS-V5/article/view/16372. Acesso em: 13 jun. 2026.