D. P. SINGH. Application of Thin Layer Activation to Determine Surface Degradation in Various Materials. Current Perspective to Physical Science Research Vol. 3, [S. l.], p. 221–232, 2023. DOI: 10.9734/bpi/cppsr/v3/8565A. Disponível em: https://stm.bookpi.org/CPPSR-V3/article/view/12903. Acesso em: 21 jul. 2026.