[1]
A. Ricard, J. Amorim, M. Abdeladim, J. P. Sarrette, and Y. K. Kim, “N, H and C-atoms Density in Flowing Afterglows of Microwave R/N2-H2 and R/N2-CH4 Discharges with R=N2, He, Ar and Applications to TiO2 Surface Nitriding”, CPCS-V8, pp. 103–143, Feb. 2021.