Stanislav Jurecka and Martin Králik. Analysis of Spectral Reflectance of Layers Formed by Anodic Etching of Silicon. CASTR-V10 [Internet]. 2021 Jul. 12 [cited 2026 Jun. 24];:64-9. Available from: https://stm.bookpi.org/CASTR-V10/article/view/2340