Stanislav JURECKA; Martin KRÁLIK. Analysis of Spectral Reflectance of Layers Formed by Anodic Etching of Silicon. Current Approaches in Science and Technology Research Vol. 10, [S. l.], p. 64–69, 2021. DOI: 10.9734/bpi/castr/v10/2413F. Disponível em: https://stm.bookpi.org/CASTR-V10/article/view/2340. Acesso em: 24 jun. 2026.