SangMin WOO; HyunJoon JEONG; JinYoung CHOI; HyungMin CHO; Jeong-Taek KONG; SoYoung KIM. Machine-Learning-Based Compact Modeling and Model Parameter Extraction for Sub-3-nm-Node Emerging Transistors. Current Approaches in Engineering Research and Technology Vol. 9, [S. l.], p. 127–155, 2024. DOI: 10.9734/bpi/caert/v9/2557. Disponível em: https://stm.bookpi.org/CAERT-V9/article/view/16125. Acesso em: 4 jul. 2026.