Characterization Techniques for Metal Chalcogenide Thin Films: Review

Abstract

Thin films have attracted huge interest because of could be used in wide applications including optoelectronic, solar cells, laser devices and gas sensor. In this work, X-ray photoelectron spectroscopy, Raman spectroscopy, Fourier transform infrared spectroscopy, UV-visible spectrophotometer and energy dispersive x-ray have been used to characterize the properties of the obtained thin films. Generally, combinatorial characterization approach is needed to determine good quality of obtained films. The main aim of this book chapter is to summarize the advantages, disadvantages and highlighted experimental results of these tools that are available for the characterization of thin films.